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The orientation of a crystal sample is checked by method of X-Ray diffraction. It is based on observing the scattered intensity of an X-Ray beam hitting a sample as a function of incident and scattered angle, polarization, and wavelength or energy. The sample mounted onto a goniometer is gradually rotated and at the same time is being bombarded with X-Rays. The crystal atoms scatter the X-Rays which land onto an X-Ray detector forming a diffraction pattern of spots.
The analysis is performed with the help of a high resolution X-Ray diffractometer and supplemental software.
Measurements are taken from 4 goniometer angles obtained by 4 azimuth positions of the sample (ϴ1, ϴ2, ϴ3 and ϴ4). The deviation of the checked crystal plane is analyzed by 2 components - ɑ1 and ɑ2 calculated as ɑ1 = (ϴ1- ϴ3)/2 and ɑ2 = (ϴ2- ϴ4)/2. |
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