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Control of Chemical Composition
The chemical composition of the grown crystals is measured by one of the two methods of mass spectrometry described below. The main difference of these methods is the way of ionizing the analyzed sample.

Spark Source Mass Spectrometry (SSMS)

Spark Source Mass Spectrometry is a semi-quantitative technology used for analyzing trace elements in solids and liquids. The technique consists in producing gas phase ions from a sample. The prepared sample is vaporized and partially ionized by an intermittent discharge or a spark. The ions are analyzed by a double-focusing mass spectrometer and separated by their mass-to-charge ratio. SSMS is a highly sensitive and comprehensive technology. It covers most of the periodic table elements from lithium to uranium and provides the possibility to determine impurity levels from sub-ppm to 0.1%.

Glow Discharge Mass Spectrometry (GDMS)

In GDMS method the sample is ionized by a glow discharge. The prepared sample serves as a cathode in a low-pressure gas or plasma. The positive ions of gas are accelerated to the cathode and erode the upper layers of the sample. The ions escaping the surface are analyzed by a double-focusing mass spectrometer. The technology provides very high sensitivity, high resolution and broad elements coverage.

Click the links below to download SSMS and GDMS results of our materials in PDF.
SSMS
GDMS CdS
GDMS CdSe
GDMS GaSe
GDMS ZnS
GDMS ZnSe
GDMS ZnTe



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